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Laser technology - A strong performance
Laser technology - a strong performance
Lasers for
material processing have been established as a tool in the industry for
many years. The required machines for this contain laser expansion
systems, beam guiding systems as well as high-power laser components,
which are always specifically orientated to the requirements of our
customers.
Our expertise in this area guarantees the exceptional quality and performance of our products in each individual case.
Engineering
Key components*
Material: optical glass, CaF2, MgF2, quartz, glassceramics, ceramic, borosilicate glass und filter glass Spherical lensesDimensions
| up to Ø 500 mm | | Radii | 1.2 mm upwards (without limit)
| Centering error
| 10" | Fitting error
| λ/40 PV, measured at 632.8 nm | Surface error
| 5/1 x 0.025
| Micro roughness
| 2 Å rms
| Average thickness tolerance
| +/- 3 µm | Diameter tolerance
| +/- 3 µm
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Aspherical lenses
Dimensions
| Ø 5 - 150 mm | Fitting error
| λ/20 PV, convex und concave, direct interferometric measurement
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Cylindrical lenses
Radii
| 2 - 50,000 mm | | Length | up to 500 mm, larger on request
| Lens width
| up to 300 mm (depending on the focal length) | Fitting error
| λ/8 PV, measured at 632.8 nm | Surface error
| 5/1 x 0.025 | Micro roughness
| 2 Å rms | Centering
| Rotation: 10", offset: 4 µm, wedge: 3µm |
Windows, prisms and prism systems Dimensions
| up to max. 1,500 mm | Flatness
| λ/40 PV, measured at 632.8 nm | | Parallelism | 1" | Angular accuracy
| 1" | Micr roughness
| 2 Å rms
| Surface defects
| 5/1 x 0.004 |
- Reticules, masks, coded and analog circles
- Structured coatings
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| Beam splitter/combiner (cemented/uncemented) | |
Assemblies Systems
- Optical assemblies and systems (cemented beam splitter, prim systems, doublets, triplets, step systems)
- Optomechanical assemblies and systems
- Elektro-optical systems
- Lens systems
- Objectives, zoom systems
- Measuring systems
- Cameras
- Laser systems
- Light sources
- Lighting systems
| Wavefront | Interferometer (4 - 24"), Shack-Hartmann wavefront sensor (UV, DUV, VIS, NIR) | Form deviation
| 3D coordinate measuring devices, calliper, CCD micrometers, Stitching interferometer | Angle precision
| Goniometer, interferometer, autocollimators | | Transmission/reflection | Spektral photometer | Surface defects
| Traveling microscopes
| Micro roughness
| White light interferometer, atomic force microscope | Imaging performance/resolution
| Computer-supported MTF-measurement, microscopic image resolution
| | Centering | Objective metrology system, laser centering station | Additional functional measurement
| Assembly-specific metrology station
| Fine correcting procedure
| Ionic beam process, robotic polishing, magnetorheological process
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*The following error and tolerance data indicates possible limit values. Specified and assessed according to ISO/MIL/DIN.
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